Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Hoenicke, Philipp; Waehlisch, Andre; Unterumsberger, Rainer; Beckhoff, Burkhard; Bogdanowicz, Janusz; Charley, Anne-Laure; Mertens, Hans; Rochat, Nevine; Hartmann, Jean-Michel; Giambacorti, Narciso

doi:10.1088/1361-6528/ad3aff

Publication:

Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Date

2024-JUL 8

Journal article

https://doi.org/10.1088/1361-6528/ad3aff

Simple item page Full metadata Statistics

Author(s)

Hoenicke, Philipp

;

Waehlisch, Andre

;

Unterumsberger, Rainer

;

;

;

;

;

;

Hartmann, Jean-Michel

;

Giambacorti, Narciso

Journal

NANOTECHNOLOGY

Statistics

73 since deposited on 2024-05-03

20last month

1last week

Acq. date: 2026-04-30

540 since deposited on 2024-05-03

Acq. date: 2026-04-30

Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Date

Author(s)

Journal

Abstract

Description

Statistics

Downloads

Views

Citations

Statistics

Downloads

Views

Citations