Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Hoenicke, Philipp; Waehlisch, Andre; Unterumsberger, Rainer; Beckhoff, Burkhard; Bogdanowicz, Janusz; Charley, Anne-Laure; Mertens, Hans; Rochat, Nevine; Hartmann, Jean-Michel; Giambacorti, Narciso

doi:10.1088/1361-6528/ad3aff

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Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

Date

2024-JUL 8

Journal article

https://doi.org/10.1088/1361-6528/ad3aff

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Hoenicke, Philipp

;

Waehlisch, Andre

;

Unterumsberger, Rainer

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;

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;

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Hartmann, Jean-Michel

;

Giambacorti, Narciso

Journal

NANOTECHNOLOGY

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Acq. date: 2026-02-04

537 since deposited on 2024-05-03

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Acq. date: 2026-02-04

Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam

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