Publication:
Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0002-7503-8922 | |
| cris.virtual.orcid | 0000-0003-4745-0167 | |
| cris.virtual.orcid | 0000-0002-3392-6892 | |
| cris.virtualsource.department | 9a3d60e7-3e8b-4366-b479-ea599b23d28b | |
| cris.virtualsource.department | 264c186e-7bc4-4bed-8d4f-11fe1bff9e26 | |
| cris.virtualsource.department | 49b2e4a0-e3c7-4524-b945-f94059646804 | |
| cris.virtualsource.orcid | 9a3d60e7-3e8b-4366-b479-ea599b23d28b | |
| cris.virtualsource.orcid | 264c186e-7bc4-4bed-8d4f-11fe1bff9e26 | |
| cris.virtualsource.orcid | 49b2e4a0-e3c7-4524-b945-f94059646804 | |
| dc.contributor.author | Hoenicke, Philipp | |
| dc.contributor.author | Waehlisch, Andre | |
| dc.contributor.author | Unterumsberger, Rainer | |
| dc.contributor.author | Beckhoff, Burkhard | |
| dc.contributor.author | Bogdanowicz, Janusz | |
| dc.contributor.author | Charley, Anne-Laure | |
| dc.contributor.author | Mertens, Hans | |
| dc.contributor.author | Rochat, Nevine | |
| dc.contributor.author | Hartmann, Jean-Michel | |
| dc.contributor.author | Giambacorti, Narciso | |
| dc.date.accessioned | 2024-05-03T17:58:11Z | |
| dc.date.available | 2024-05-03T17:58:11Z | |
| dc.date.issued | 2024-JUL 8 | |
| dc.description.wosFundingText | This project has received funding from the ECSEL Joint Undertaking (JU) IT2 under Grant agreement No. 875999. The JU receives support from the European Union's Horizon 2020 research and innovation programme and the Netherlands, Belgium, Germany, France, Austria, Hungary, the United Kingdom, Romania and Israel. In addition, this project has received funding from the European Union's Horizon 2020 research and innovation programme under Grant agreement No. 861857 CHALLENGES as well as from the Horizon Europe under grant agreement 101096772-14ACMOS. | |
| dc.identifier.doi | 10.1088/1361-6528/ad3aff | |
| dc.identifier.issn | 0957-4484 | |
| dc.identifier.pmid | MEDLINE:38579688 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43903 | |
| dc.publisher | IOP Publishing Ltd | |
| dc.source.beginpage | 285702 | |
| dc.source.issue | 28 | |
| dc.source.journal | NANOTECHNOLOGY | |
| dc.source.numberofpages | 8 | |
| dc.source.volume | 35 | |
| dc.subject.keywords | MONOCHROMATOR BEAMLINE | |
| dc.subject.keywords | XRF | |
| dc.subject.keywords | SAMPLES | |
| dc.subject.keywords | PTB | |
| dc.subject.keywords | QUANTIFICATION | |
| dc.subject.keywords | SPECTROMETRY | |
| dc.subject.keywords | RADIATION | |
| dc.title | Reference-free x-ray fluorescence analysis with a micrometer-sized incident beam | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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