Browsing by Author "Hase, Thomas"
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Publication Exploiting energy sequencing of low energy SIMS to determine intrinsic chemical profiles with sub-nm precision
; Hase, ThomasJournal article2018, Journal of Vacuum Science and Technology B, (36) 3, p.03F125Publication Interface profiling to sub-nm precision using uleSIMS
Meeting abstract2017, 21st International Conference on Secondary Ion Mass Spectrometry - SIMS, 10/09/2017, p.68Publication Si1-xGex/Si interface profiles measured to sub-nanometer precision using uleSIMS energy sequencing
Journal article2016, Journal of the American Society for Mass Spectrometry, (27) 10, p.1694-1702