Publication:
Si1-xGex/Si interface profiles measured to sub-nanometer precision using uleSIMS energy sequencing
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1795 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-17
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Views
1795 since deposited on 2021-10-23
1last month
Acq. date: 2025-12-17
Citations