Browsing by Author "Hasebe, T."
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Publication Calibration of very fast TLP transients
Proceedings paper2009, RCJ ( Reliability Center for electronic components of Japan ) Symposium, 22/10/2009, p.63-68Publication Faster ESD device characterization with wafer-level HBM
Proceedings paper2007, 20th IEEE International Conference on Microelectronic Test Structures - ICMTS, 19/03/2007, p.93-96Publication RF ESD protection strategies - the design and performance trade-off challenges
Proceedings paper2005-09, Proceedings of the IEEE Custom Integrated Circuits Conference, 18/09/2005, p.489-496