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Browsing by Author "Hatchtel, Jordan"

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    Activation energies for oxide- and interface-trap charge generation due to negative-bias--temperature stress of Si-capped SiGe-pMOSFETs

    Xing, Guo
    ;
    Hatchtel, Jordan
    ;
    Linten, Dimitri  
    ;
    Mitard, Jerome  
    ;
    Witters, Liesbeth  
    Journal article
    2015-09, IEEE Transactions on Device and Materials Reliability, (15) 3, p.352-357

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