Browsing by Author "Hatem, Firas"
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Publication Cycling Induced Metastable Degradation in GeSe Ovonic Threshold Switching Selector
Journal article2021, IEEE ELECTRON DEVICE LETTERS, (42) 10, p.1448-1451Publication Stochastic computing based on volatile GeSe ovonic threshold switching selectors
Journal article2020, IEEE Electron Device Letters, (41) 10, p.1496-1499Publication The over-reset phenomenon in Ta2O5 RRAM device investigated by the RTN-based defect probing technique
Journal article2018, IEEE Electron Device Letters, (39) 7, p.955-958