Browsing by Author "Hatta, Sharifah Wan Muhamad"
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Publication NBTI-generated defects in nanoscaled devices: fast characterization methodology and modeling
; Hatta, Sharifah Wan MuhamadJournal article2017, IEEE Transactions on Electron Devices, (64) 10, p.4011Publication Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation
Journal article2017, IEEE Transactions on Electron Devices, (64) 4, p.1467-1473