Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

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Author(s)

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Manut, Azrif B.

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Hatta, Sharifah Wan Muhamad

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Zhang, Wei Dong

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Linten, Dimitri

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Groeseneken, Guido

Journal

IEEE Transactions on Electron Devices

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1969 since deposited on 2021-10-24

Acq. date: 2025-10-28