Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

Gao, Rui; Manut, Azrif B.; Ji, Zhigang; Ma, Jigang; Duan, Meng; Zhang, Jian Fu; Franco, Jacopo; Hatta, Sharifah Wan Muhamad; Zhang, Wei Dong; Kaczer, Ben; Vigar, David; Linten, Dimitri; Groeseneken, Guido

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Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

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2017

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Hatta, Sharifah Wan Muhamad

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IEEE Transactions on Electron Devices

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Acq. date: 2025-12-11

Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

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