Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

Gao, Rui; Manut, Azrif B.; Ji, Zhigang; Ma, Jigang; Duan, Meng; Zhang, Jian Fu; Franco, Jacopo; Hatta, Sharifah Wan Muhamad; Zhang, Wei Dong; Kaczer, Ben; Vigar, David; Linten, Dimitri; Groeseneken, Guido

Publication:

Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

Date

2017

Journal article

Simple item page Full metadata Statistics

Files

36909.pdf 2.38 MB

Author(s)

;

;

;

;

;

;

;

Hatta, Sharifah Wan Muhamad

;

;

;

;

;

Journal

IEEE Transactions on Electron Devices

Statistics

1981 since deposited on 2021-10-24

1last month

Acq. date: 2026-02-24

Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

Date

Files

Author(s)

Journal

Abstract

Description

Statistics

Views

Citations

Statistics

Views

Citations