Publication:

Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

Date

2017
Journal article
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dc.contributor.authorGao, Rui
dc.contributor.authorManut, Azrif B.
dc.contributor.authorJi, Zhigang
dc.contributor.authorMa, Jigang
dc.contributor.authorDuan, Meng
dc.contributor.authorZhang, Jian Fu
dc.contributor.authorFranco, Jacopo
dc.contributor.authorHatta, Sharifah Wan Muhamad
dc.contributor.authorZhang, Wei Dong
dc.contributor.authorKaczer, Ben
dc.contributor.authorVigar, David
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.accessioned2021-10-24T04:54:46Z
dc.date.available2021-10-24T04:54:46Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28368
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7870682/
dc.source.beginpage1467
dc.source.endpage1473
dc.source.issue4
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume64
dc.title

Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation

dc.typeJournal article
dspace.entity.typePublication
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