Browsing by Author "Hehenberger, Philipp"
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Publication A rigorous study of measurement techniques for negative bias temperature instability
Proceedings paper2007-10, IEEE International Integrated Reliability Workshop Final Report - IIRW, 15/10/2007, p.6-11Publication A two-stage model for negative bias temperature instability
Proceedings paper2009-04, 47th Annual IEEE International Reliability Physics Symposium, 26/04/2009, p.33-44Publication Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique
Proceedings paper2009-04, 47th Annual IEEE International Reliability Physics Symposium, 26/04/2009, p.1033-1038Publication Quantum-mechanical modeling of NBTI in High-k SiGe MOSFETs
Proceedings paper2011, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 8/09/2011