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Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique
Publication:
Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique
Date
2009-04
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hehenberger, Philipp
;
Aichinger, Thomas
;
Grasser, Tibor
;
Goes, Wolfgang
;
Triebl, O.
;
Kaczer, Ben
;
Nelhiebel, M.
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1939
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations
Metrics
Views
1939
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations