Browsing by Author "Hehenberger, Phillip"
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Publication Recent advances in understanding the bias temperature instability
Proceedings paper2010-12, IEEE International Electron Devices Meeting - IEDM, 6/12/2010Publication Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise
Publication The paradigm shift in understanding the bias temperature instability: from reaction–diffusion to switching oxide traps
Journal article2011, IEEE Transactions on Electron Devices, (58) 11, p.3652-3666