Browsing by Author "Hijzen, E."
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Publication Impact of lateral and vertical scaling on the reliability of a low-complexity 200 GHz SiGe: CHBT
Proceedings paper2005, Proceedings 4th International Conference on Silicon Epitaxy and Heterosctructures - ICSI-4, 23/05/2005, p.62-63Publication Influence of lateral device scaling and airgap deep trench isolation on reliability performance of 200GHz SiGe:C HBTs
Journal article2007, Semiconductor Science and Technology, (22) 1, p.S9-S12