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Browsing by Author "Hill, Eric"

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    A full-automatic test system for characterizing wide-I/O micro-bump probe cards

    Marinissen, Erik Jan  
    ;
    Fodor, Ferenc  
    ;
    De Wachter, Bart  
    ;
    Kiesewetter, Joerg
    ;
    Hill, Eric
    ;
    Smith, Ken
    Proceedings paper
    2017-06, IEEE Semiconductor Wafer Test Workshop - SWTW, 4/06/2017, p.812-848
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    A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards

    Marinissen, Erik Jan  
    ;
    Fodor, Ferenc  
    ;
    De Wachter, Bart  
    ;
    Kiesewetter, Joerg
    ;
    Hill, Eric
    ;
    Smith, Ken
    Proceedings paper
    2017-09, IEEE International Test Conference Asia - ITC-Asia, 13/09/2017
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    Evaluation of advanced probe cards for large-array fine-pitch micro-bumps

    Marinissen, Erik Jan  
    ;
    Fodor, Ferenc  
    ;
    De Wachter, Bart  
    ;
    Kiesewetter, Joerg
    ;
    Smith, Ken
    ;
    Hill, Eric
    Journal article
    2017-11, Chip Scale Review, (21) 6, p.16-20

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