Browsing by Author "Hill, Eric"
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Publication A full-automatic test system for characterizing wide-I/O micro-bump probe cards
; ; ; ;Kiesewetter, Joerg ;Hill, EricSmith, KenProceedings paper2017-06, IEEE Semiconductor Wafer Test Workshop - SWTW, 4/06/2017, p.812-848Publication A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards
; ; ; ;Kiesewetter, Joerg ;Hill, EricSmith, KenProceedings paper2017-09, IEEE International Test Conference Asia - ITC-Asia, 13/09/2017Publication Evaluation of advanced probe cards for large-array fine-pitch micro-bumps
; ; ; ;Kiesewetter, Joerg ;Smith, KenHill, EricJournal article2017-11, Chip Scale Review, (21) 6, p.16-20