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A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards
Publication:
A fully automatic test system for characterizing large-array fine-pitch micro-bump probe cards
Date
2017-09
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Fodor, Ferenc
;
De Wachter, Bart
;
Kiesewetter, Joerg
;
Hill, Eric
;
Smith, Ken
Journal
Abstract
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1905
since deposited on 2021-10-24
Acq. date: 2025-10-27
Citations
Metrics
Views
1905
since deposited on 2021-10-24
Acq. date: 2025-10-27
Citations