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Browsing by Author "Hinnen, Paul"

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    3D features measurement using YieldStar, an angle resolved polarized scatterometer

    Charley, Anne-Laure  
    ;
    Leray, Philippe  
    ;
    D'have, Koen  
    ;
    Cheng, Shaunee
    ;
    Hinnen, Paul
    ;
    Li, Fahong
    Proceedings paper
    2011, Metrology, Inspection, and Process Control XXV, 27/02/2011, p.79712E
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    A single metrology tool solution for complete exposure tool setup

    Laidler, David  
    ;
    D'have, Koen  
    ;
    Charley, Anne-Laure  
    ;
    Leray, Philippe  
    ;
    Cheng, Shaunee
    ;
    Dusa, Mircea  
    Proceedings paper
    2010, Metrology, Inspection and Process Control for Microlithography XXIV, 21/02/2010, p.763809
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    Focus and dose de-convolution technique for improved CD-control of immersion clusters

    Charley, Anne-Laure  
    ;
    D'have, Koen  
    ;
    Leray, Philippe  
    ;
    Laidler, David  
    ;
    Cheng, Shaunee
    ;
    Dusa, Mircea  
    Proceedings paper
    2010, Metrology, Inspection and Process Control for Microlithography XXIV, 21/02/2010, p.763808

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