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Browsing by Author "Hoffman, M."

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    Advanced single chemistry alkaline cleaning in a STEAG single tank tool

    Onsia, Bart  
    ;
    Schellkes, E.
    ;
    Vos, Rita  
    ;
    De Gendt, Stefan  
    ;
    Doll, O.
    ;
    Fester, A.
    ;
    Kolbesen, B.
    Proceedings paper
    2002, Cleaning Technology in Semiconductor Device Manufacturing VII, 4/09/2001, p.23-30
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    Advanced single chemistry alkaline cleaning in a STEAG single tank tool

    Onsia, Bart  
    ;
    Schellkes, E.
    ;
    Vos, Rita  
    ;
    De Gendt, Stefan  
    ;
    Doll, O.
    ;
    Fester, A.
    ;
    Kolbesen, B. O.
    Meeting abstract
    2001, 200th Meeting of the Electrochemical Society: 7th International Symposium on Cleaning Technology in Semiconductor Device Manufac, 2/09/2001
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    Removal of submicrometer particles from silicon wafer surfaces using HF-based cleaning mixtures

    Vos, Rita  
    ;
    Lux, Marcel  
    ;
    Xu, Kaidong
    ;
    Fyen, Wim
    ;
    Kenens, Conny
    ;
    Conard, Thierry  
    ;
    Mertens, Paul  
    Journal article
    2001, Journal of the Electrochemical Society, (148) 12, p.G683-G691

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