Browsing by Author "Hogg, S.M."
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Publication Dose dependent phenomena arising from implantation of Er into Si
Journal article2005, J. Applied Physics, (97) 8, p.083514-1-083514-8Publication Strain relaxation of SiGe buffers on Si and SOI wafers induced by He+ ion implantation and thermal annealing
Publication Thin strain relaxed SiGe buffer layers on Si and SOI wafers made by He+ ion implantation and annealing