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Browsing by Author "Honicke, P."

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    Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray fluorescence

    Honicke, P.
    ;
    Beckhoff, B.
    ;
    Kolbe, M.
    ;
    List, Scott
    ;
    Conard, Thierry  
    ;
    Struyf, Herbert  
    Journal article
    2008, Spectrochimica Acta B, (63) 12, p.1359-1364
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    Towards passivation of Ge(100) surfaces by sulfur adsorption from (NH4)2S solution: a combined NEXAFS, STM and LEED study

    Fleischmann, Claudia  
    ;
    Sioncke, Sonja
    ;
    Couet, S.
    ;
    Schouteden, K.
    ;
    Beckhoff, Burkhard
    Journal article
    2011, Journal of the Electrochemical Society, (158) 5, p.H589-H594

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