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Browsing by Author "Horsfall, Alton"

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    A NEMS based sensor to monitor stress in deep sub-micron Cu/Low-$k$ interconnects

    Wilson, Chris  
    ;
    Croes, Kristof  
    ;
    Van Cauwenberghe, Marc  
    ;
    Tokei, Zsolt  
    ;
    Beyer, Gerald  
    Journal article
    2009, Semicond. Sci. Technol., (24) 11, p.115018
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    Analysis and characterization of a mechanical sensor to monitor stress in interconnect features

    Wilson, Chris  
    ;
    Croes, Kristof  
    ;
    Tokei, Zsolt  
    ;
    Beyer, Gerald  
    ;
    Gallacher, Barry
    ;
    Bull, Steve
    Journal article
    2010, Thin Solid Films, (519) 1, p.443-449

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