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Browsing by Author "Hososhima, M."

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    Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particles

    Ohyama, Hidenori
    ;
    Hakata, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, C.
    ;
    Sunaga, H.
    ;
    Hososhima, M.
    Proceedings paper
    1998, Semiconductors for Room-Temperature Radiation Detector Applications II;, p.435-440
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    Radiation damages of Si avalanche photodiodes by 1-MeV fast neutrons and 220-MEV carbon particles

    Ohyama, Hidenori
    ;
    Hakata, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, C.
    ;
    Takami, Y.
    ;
    Hayama, J.
    ;
    Tokuyama, J.
    Proceedings paper
    1998, Semiconductors for Room-Temperature Radiation Detector Applications II;, p.429-434

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