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Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particles
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Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particles
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ohyama, Hidenori
;
Hakata, T.
;
Simoen, Eddy
;
Claeys, C.
;
Sunaga, H.
;
Hososhima, M.
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1919
since deposited on 2021-10-01
Acq. date: 2026-02-24
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Views
1919
since deposited on 2021-10-01
Acq. date: 2026-02-24
Citations