Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particles

dc.contributor.author	Ohyama, Hidenori
dc.contributor.author	Hakata, T.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, C.
dc.contributor.author	Sunaga, H.
dc.contributor.author	Hososhima, M.
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-01T08:35:10Z
dc.date.available	2021-10-01T08:35:10Z
dc.date.issued	1998
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2819
dc.source.beginpage	435
dc.source.conference	Semiconductors for Room-Temperature Radiation Detector Applications II;
dc.source.conferencelocation
dc.source.endpage	440
dc.title	Degradation and recovery of Si diodes by 20-MEV protons and 220-MEV carbon particles
dc.type	Proceedings paper
dspace.entity.type	Publication
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