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Browsing by Author "Hou, A."

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    Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics

    Kerber, Andreas
    ;
    Cartier, Eduard
    ;
    Pantisano, Luigi
    ;
    Degraeve, Robin  
    ;
    Kauerauf, Thomas
    Journal article
    2003, IEEE Electron Device Letters, (24) 2, p.87-89

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