Publication:

Origin of the threshold voltage instability in SiO2/HfO2 dual layer gate dielectrics

Date

2003

Journal article

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Author(s)

Kerber, Andreas

;

Cartier, Eduard

;

Pantisano, Luigi

;

Degraeve, Robin

;

Kauerauf, Thomas

;

Kim, Young-Chang

;

;

Groeseneken, Guido

;

;

Journal

IEEE Electron Device Letters

Statistics

1925 since deposited on 2021-10-15

Acq. date: 2026-01-26