Browsing by Author "Hou, F. C."
Now showing 1 - 2 of 2
- Results Per Page
- Sort Options
Publication Bulk defect induced low-frequency noise in n+-p silicon diodes
Journal article1998, IEEE Trans. Electron Devices, (45) 12, p.2528-2536Publication Noise characterization of gated silicon p-n diodes
Proceedings paper1997, Noise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference, 14/07/1997, p.542-545