Browsing by Author "Hruska, P."

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High frequency RTS noise in submicron MOSFETs

Sikula, J.
;
Hruska, P.
;
Vasina, Petr
;
Claeys, Cor
;
Simoen, Eddy
;
Matulionis, A.
;
Stadalnikas, A.
Proceedings paper
1996, Proceedings 3rd ELEN Workshop, 5/11/1996, p.144-149
Noise and THI reliability indicators for thin film resistors

Sikula, J.
;
Hruska, P.
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Vasina, Petr
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Schauer, P.
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Kolarova, R.
;
Hajek, K.
;
Stadalnikas, A.
Proceedings paper
1996, Proceedings of CARTS-EUROPE'96. 10th European Passive Components Symposium, 7/10/1996, p.200-205
RTS noise in submicron MOSFETs

Sikula, J.
;
Hruska, P.
;
Vasina, Petr
;
Claeys, C.
;
Simoen, Eddy
;
Stadalnikas, A.
Oral presentation
1996, 20th Workshop; May 19-22, 1996; Vilnius, Lithuania.
Transition intensities and noise spectra in submicron MOSFETs

Härtler, G.
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Golze, U.
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Sikula, J.
;
Hruska, P.
;
Vasina, Petr
;
Claeys, Cor
;
Simoen, Eddy
Proceedings paper
1997, Noise in Physical Systems and 1/f Fluctuations: Proceedings of the 14th International Conference, 14/07/1997, p.224-227
Transition probabilities and noise spectra in submicron MOSFETs

Haertler, C.
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Golze, U.
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Sikula, J.
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Sikulova, M.
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Hruska, P.
;
Vasina, Petr
;
Claeys, Cor
;
Simoen, Eddy
Proceedings paper
1996, Proceedings 3rd ELEN Workshop, 5/11/1996, p.78-82