Browsing by Author "Hseun, Jing-Hua"
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory
Journal article2023, NANOMATERIALS, (9) 10, p.Art. 2104