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Browsing by Author "Hsu, Po-Chun"

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    Defect Characterization in High-Electron-Mobility Transistors with Regrown p-GaN Gate by Low-Frequency Noise and Deep-Level Transient Spectroscopy

    Hsu, Po-Chun
    ;
    Simoen, Eddy  
    ;
    Liang, Hu  
    ;
    De Jaeger, Brice  
    ;
    Bakeroot, Benoit  
    ;
    Wellekens, Dirk  
    Journal article
    2021, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, (218) 23, p.2100227

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