Browsing by Author "Hsu, Po-Chun"
Now showing 1 - 1 of 1
- Results per page
- Sort Options
Publication Defect Characterization in High-Electron-Mobility Transistors with Regrown p-GaN Gate by Low-Frequency Noise and Deep-Level Transient Spectroscopy
Journal article2021, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, (218) 23, p.2100227