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Browsing by Author "Hsu, S."

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    Freeform illumination sources: an experimental study of source-mask optimization for 22nm SRAM cells

    Bekaert, Joost  
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    Laenens, Bart
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    Verhaegen, Staf
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    Van Look, Lieve  
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    Trivkovic, Darko  
    Proceedings paper
    2010, Optical Microlithography XXIII, 21/02/2010, p.764008
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    Gray bar masking: fabrication and imaging for 193 nm

    Smith, Bruce
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    Vandenberghe, Geert  
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    Martin, P. W.
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    Rack, P.
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    Hsu, S.
    ;
    Chen, F.
    Oral presentation
    2001, 21st Annual BACUS Symposium on Photomask Technology; October 2001; Monterey, CA, USA.
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    The magnitude of potential exposure-tool-induced critical dimension and overlay errors in double dipole lithography for the 65-nm and 45-nm technology nodes

    Chiou, T.B.
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    Chen, A.C.
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    Tseng, S.E.
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    Eurlings, M.
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    Hendrickx, Eric  
    ;
    Hsu, S.
    Journal article
    2004, Japanese Journal of Applied Physics. Part 1: Regular Papers, (43) 6B, p.3672-3679

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