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Browsing by Author "Hu, L.N."

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    Deep traps in In0.3Ga0.7As nFinFETs, studied by generation-recombination noise

    He, Liang
    ;
    Chen, H.
    ;
    Guo, D.D.
    ;
    Hu, L.N.
    ;
    Qin, Y.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Kunert, Bernardette  
    Proceedings paper
    2017, International Conference on Noise and 1/f Fluctuations - ICNF, 20/06/2017, p.1-4

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