Publication:
Deep traps in In0.3Ga0.7As nFinFETs, studied by generation-recombination noise
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1983 since deposited on 2021-10-24
1last month
Acq. date: 2026-03-17
Citations
Statistics
Views
1983 since deposited on 2021-10-24
1last month
Acq. date: 2026-03-17
Citations