Browsing by Author "Huang, S.-H."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Improvement on CDM ESD robustness of high-voltage tolerant nLDMOS SCR devices by using differential doped gate
Proceedings paper2014, IEEE International Reliability Physics Symposium - IRPS, 1/06/2014, p.4C.2