Publication:
Improvement on CDM ESD robustness of high-voltage tolerant nLDMOS SCR devices by using differential doped gate
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1868 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-08
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Metrics
Views
1868 since deposited on 2021-10-22
1last month
Acq. date: 2025-12-08
Citations