Publication:
Improvement on CDM ESD robustness of high-voltage tolerant nLDMOS SCR devices by using differential doped gate
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1868 since deposited on 2021-10-22
Acq. date: 2026-02-26
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Statistics
Views
1868 since deposited on 2021-10-22
Acq. date: 2026-02-26
Citations