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Browsing by Author "Humbeeck, J.V."

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    Investigation of the reliability of Cu and Co UBM layers in thermal-cycling tests

    Labie, Riet  
    ;
    Beyne, Eric  
    ;
    Mertens, Robert  
    ;
    Ratchev, Petar
    ;
    Humbeeck, J.V.
    Proceedings paper
    2003-12, EPTC - Electronics Packaging Technology Conference, 10/12/2003, p.584-588

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