Browsing by Author "Hurkx, Fred"
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Publication A fast and reliable method used to investigate the size-dependent retention lifetime of a phase-change line cell
Journal article2011, Solid-State Electronics, (58) 1, p.17-22Publication A novel method for extracting the temperature-dependent crystal-growth parameters in fast-growth phase-change memories
Journal article2010, IEEE Electron Device Letters, (31) 11, p.1287-1289Publication Degradation of the reset switching during endurance testing of a phase-change line cell
Journal article2009, IEEE Transactions on Electron Devices, (56) 2, p.354-358Publication Evidence of the prominent role of the time-under-melt parameter in the reset switching of phase-change line cells
Proceedings paper2008, Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - NVSMW/ICMTD, 18/05/2008, p.37-38Publication Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method
Proceedings paper2010, IEEE International Memory Workshop - IMW, 16/05/2010, p.33-36Publication Transient characteristics of the reset programming of a phase-change line cell and the effect of the reset parameters on the obtained state
Journal article2009, IEEE Transactions on Electron Devices, (56) 7, p.1499-1506