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Degradation of the reset switching during endurance testing of a phase-change line cell
Publication:
Degradation of the reset switching during endurance testing of a phase-change line cell
Date
2009
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Goux, Ludovic
;
Tio Castro, David
;
Hurkx, Fred
;
Lisoni, Judit
;
Delhougne, Romain
;
Gravesteijn, Dirk
;
Attenborough, Karen
;
Wouters, Dirk
Journal
IEEE Transactions on Electron Devices
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1957
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1957
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations