Publication:
Degradation of the reset switching during endurance testing of a phase-change line cell
Date
| dc.contributor.author | Goux, Ludovic | |
| dc.contributor.author | Tio Castro, David | |
| dc.contributor.author | Hurkx, Fred | |
| dc.contributor.author | Lisoni, Judit | |
| dc.contributor.author | Delhougne, Romain | |
| dc.contributor.author | Gravesteijn, Dirk | |
| dc.contributor.author | Attenborough, Karen | |
| dc.contributor.author | Wouters, Dirk | |
| dc.contributor.imecauthor | Goux, Ludovic | |
| dc.contributor.imecauthor | Delhougne, Romain | |
| dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
| dc.date.accessioned | 2021-10-17T22:29:51Z | |
| dc.date.available | 2021-10-17T22:29:51Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0018-9383 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15380 | |
| dc.source.beginpage | 354 | |
| dc.source.endpage | 358 | |
| dc.source.issue | 2 | |
| dc.source.journal | IEEE Transactions on Electron Devices | |
| dc.source.volume | 56 | |
| dc.title | Degradation of the reset switching during endurance testing of a phase-change line cell | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |