Browsing by Author "Hurley, P.K"
Now showing 1 - 1 of 1
- Results per page
- Sort Options
Publication Extrinsic stacking fault generation related to high-k dielectric growth on a Si substrate
;Volkos, S.N. ;Bernardini, S. ;Rigopoulos, N. ;Efthymiou, E.S. ;Hawkins, I.D.Hamilton, B.Journal article2007, Microelectronic Engineering, (84) 9_10, p.2374-2377