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Browsing by Author "Hurley, P.K"

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    Extrinsic stacking fault generation related to high-k dielectric growth on a Si substrate

    Volkos, S.N.
    ;
    Bernardini, S.
    ;
    Rigopoulos, N.
    ;
    Efthymiou, E.S.
    ;
    Hawkins, I.D.
    ;
    Hamilton, B.
    Journal article
    2007, Microelectronic Engineering, (84) 9_10, p.2374-2377

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