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Browsing by Author "Imai, Y."

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    X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates

    Ebihara, K.
    ;
    Harada, S.
    ;
    Kikkawa, J.
    ;
    Nakamura, Y.
    ;
    Sakai, A.
    ;
    Wang, Gang
    ;
    Caymax, Matty  
    ;
    Imai, Y.
    Proceedings paper
    2010, SiGe, Ge, and related Compounds 4: Materials, Processing and Devices, 10/10/2010, p.887-892
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    Publication

    X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates

    Ebihara, K.
    ;
    Harada, S.
    ;
    Kikkawa, J.
    ;
    Nakamura, Y.
    ;
    Sakai, A.
    ;
    Wang, Gang
    ;
    Caymax, Matty  
    ;
    Imai, Y.
    Meeting abstract
    2010, 218th ECS Fall Meeting, 10/10/2010, p.1946

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