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X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates
Publication:
X-ray microdiffraction study on crystallinity of micron-sized Ge films selectively grown on Si(001) substrates
Date
2010
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ebihara, K.
;
Harada, S.
;
Kikkawa, J.
;
Nakamura, Y.
;
Sakai, A.
;
Wang, Gang
;
Caymax, Matty
;
Imai, Y.
;
Kimura, S.
;
Sakata, O.
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2071
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
2071
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations