Browsing by Author "Inoue, F."
Now showing 1 - 1 of 1
- Results Per Page
- Sort Options
Publication Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
Journal article2023, ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY, (12) 3, p.Art. 033002