Publication:
Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
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1363 since deposited on 2023-03-25
251last month
50last week
Acq. date: 2026-08-07
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902 since deposited on 2023-03-25
7last month
2last week
Acq. date: 2026-08-07
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