Publication:
Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
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829 since deposited on 2023-03-25
70last month
16last week
Acq. date: 2026-02-24
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884 since deposited on 2023-03-25
1last month
Acq. date: 2026-02-24
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