Publication:
Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
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657 since deposited on 2023-03-25
93last month
13last week
Acq. date: 2025-12-16
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880 since deposited on 2023-03-25
2last month
Acq. date: 2025-12-16
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