Publication:
Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
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894 since deposited on 2023-03-25
81last month
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885 since deposited on 2023-03-25
1last month
Acq. date: 2026-03-17
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