Publication:
Origin of Voids at the SiO2/SiO2 and SiCN/SiCN Bonding Interface Using Positron Annihilation Spectroscopy and Electron Spin Resonance
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710 since deposited on 2023-03-25
76last month
18last week
Acq. date: 2026-01-06
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882 since deposited on 2023-03-25
2last month
2last week
Acq. date: 2026-01-05
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