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Browsing by Author "Ioannidis, E."

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    Publication

    Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

    Michl, J.
    ;
    Grill, Alexander  
    ;
    Stampfer, B.
    ;
    Waldhoer, D.
    ;
    Schleich, C.
    ;
    Knobloch, T.
    ;
    Ioannidis, E.
    Proceedings paper
    2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021

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