Browsing by Author "Jakschik, S."
Now showing 1 - 4 of 4
- Results Per Page
- Sort Options
Publication A 50nm high-k poly silicon gate stack with a buried SiGe channel
Proceedings paper2007, International Symposium on VLSI Technology, Systems and Applications, 23/04/2007Publication High resolution elastic recoil detection
Journal article2004, Nuclear Instruments & Methods in Physics Research B, 219-220, p.333-343Publication Influence of stress-induced leakage current on reliability of HfSiOx
Journal article2007, IEEE Trans. Device and Materials Reliability, (7) 2, p.310-314Publication Ni(Pt)Si thermal stability improvement by carbon implantation
Meeting abstract2008, 213th ECS Meeting, 18/05/2008, p.675