Browsing by Author "Johnsson, David"

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Impact of tester source impedance on HBM failure level

Scholz, Mirko
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Chen, Shih-Hung
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Linten, Dimitri
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Thijs, Steven
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Sawada, Masanori
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Johnsson, David
Proceedings paper
2012, International ESD Workshop, 14/05/2012, p.329-338
Miscorrelation between IEC61000-4-2 type of HMM tester and 50 $X HMM tester

Scholz, Mirko
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Chen, Shih-Hung
;
Linten, Dimitri
;
Johnsson, David
;
Gallerano, Antonio
Proceedings paper
2012, EOS/ESD Symposium, 9/09/2012