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Impact of tester source impedance on HBM failure level
Publication:
Impact of tester source impedance on HBM failure level
Date
2012
Proceedings Paper
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23915.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Scholz, Mirko
;
Chen, Shih-Hung
;
Linten, Dimitri
;
Thijs, Steven
;
Sawada, Masanori
;
Johnsson, David
;
Groeseneken, Guido
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1852
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Metrics
Views
1852
since deposited on 2021-10-20
392
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations