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Browsing by Author "Jono, T."

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    Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs

    Ohyama, H.
    ;
    Hayama, K.
    ;
    Takakura, K.
    ;
    Jono, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    Journal article
    2003, Microelectronic Engineering, (66) 1_4, p.530-535
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    Influence of irradiation temperature on electron-irradiated STI Si diodes

    Ohyama, Hidenori
    ;
    Hayama, Kiyoteru
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    Takakura, K.
    ;
    Miura, T.
    ;
    Jono, T.
    ;
    Simoen, Eddy  
    ;
    Poyai, Amporn
    Proceedings paper
    2002, Proceedings of the 4th International Conference on Materials for Microelectronics, 10/06/2002, p.299-302
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    Influence of irradiation temperature on electron-irradiated STI Si diodes

    Ohyama, H.
    ;
    Hayama, K.
    ;
    Takakura, K.
    ;
    Miura, T.
    ;
    Shigaki, K.
    ;
    Jono, T.
    ;
    Simoen, Eddy  
    ;
    Poyai, Amporn
    Journal article
    2003, Journal of Materials Science: Materials in Electronics, (14) 5_7, p.451-454
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    Irradiation temperature dependence of radiation damage in STI Si diodes

    Ohyama, H.
    ;
    Hayama, K.
    ;
    Takakura, K.
    ;
    Miura,
    ;
    Shigaki, K.
    ;
    Jono, T.
    ;
    Simoen, Eddy  
    ;
    Poyai, Amporn
    Journal article
    2003, Microelectronic Engineering, (66) 1_4, p.517-521
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    Radiation damage in Si photodiodes by high-temperature irradiation

    Ohyama, H.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Takakura, K.
    ;
    Matsuoka, H.
    ;
    Jono, T.
    ;
    Uemura, J.
    ;
    Kishikawa, T.
    Journal article
    2003, Physica E: Low-Dimensional Systems & Nanostructures, (16) 3_4, p.533-538
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    Radiation damage induced in Si photodiodes by High-temerature neutron irradiation

    Ohyama, H.
    ;
    Takakura, K.
    ;
    Matsuoka, H.
    ;
    Jono, T.
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Uemura, J.
    ;
    Kishikawa, T.
    Journal article
    2003, Journal of Materials Sscience: Materials in Electronics, (14) 5_7, p.437-440
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    Radiation damage induced in Si photodiodes by high-temperature neutron irradiation

    Ohyama, Hidenori
    ;
    Simoen, Eddy  
    ;
    Claeys, Cor
    ;
    Takakura, K.
    ;
    Matsuoko, H.
    ;
    Jono, T.
    ;
    Uemura, J.
    Proceedings paper
    2002, Extended Abstracts of the 4th International Conference on Materials for Microelectronics and Nanoengineering, 10/06/2002, p.135-139
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    Radiation source dependence on floating-body effect in thin gate oxide fully-depleted SOI N-MOSFETs

    Hayama, K.
    ;
    Ohyama, H.
    ;
    Takakura, K.
    ;
    Kuboyama, S.
    ;
    Jono, T.
    ;
    Oka, K.
    ;
    Matsuda, S.
    ;
    Simoen, Eddy  
    Proceedings paper
    2004, Proceedings International Workshop on Radiation Effects in Semiconductor Devices for Space Applications, p.249-252

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