Browsing by Author "Jono, T."
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Publication Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs
Journal article2003, Microelectronic Engineering, (66) 1_4, p.530-535Publication Influence of irradiation temperature on electron-irradiated STI Si diodes
Proceedings paper2002, Proceedings of the 4th International Conference on Materials for Microelectronics, 10/06/2002, p.299-302Publication Influence of irradiation temperature on electron-irradiated STI Si diodes
;Ohyama, H. ;Hayama, K. ;Takakura, K. ;Miura, T. ;Shigaki, K. ;Jono, T.; Poyai, AmpornJournal article2003, Journal of Materials Science: Materials in Electronics, (14) 5_7, p.451-454Publication Irradiation temperature dependence of radiation damage in STI Si diodes
Journal article2003, Microelectronic Engineering, (66) 1_4, p.517-521Publication Radiation damage in Si photodiodes by high-temperature irradiation
;Ohyama, H.; ;Claeys, Cor ;Takakura, K. ;Matsuoka, H. ;Jono, T. ;Uemura, J.Kishikawa, T.Journal article2003, Physica E: Low-Dimensional Systems & Nanostructures, (16) 3_4, p.533-538Publication Radiation damage induced in Si photodiodes by High-temerature neutron irradiation
;Ohyama, H. ;Takakura, K. ;Matsuoka, H. ;Jono, T.; ;Claeys, Cor ;Uemura, J.Kishikawa, T.Journal article2003, Journal of Materials Sscience: Materials in Electronics, (14) 5_7, p.437-440Publication Radiation damage induced in Si photodiodes by high-temperature neutron irradiation
Proceedings paper2002, Extended Abstracts of the 4th International Conference on Materials for Microelectronics and Nanoengineering, 10/06/2002, p.135-139Publication Radiation source dependence on floating-body effect in thin gate oxide fully-depleted SOI N-MOSFETs
Proceedings paper2004, Proceedings International Workshop on Radiation Effects in Semiconductor Devices for Space Applications, p.249-252