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Articles
Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs
Publication:
Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs
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Date
2003
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ohyama, H.
;
Hayama, K.
;
Takakura, K.
;
Jono, T.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Microelectronic Engineering
Abstract
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1964
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-11
Citations
Metrics
Views
1964
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-11
Citations